The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2020

Filed:

Jul. 31, 2014
Applicant:

Ent. Services Development Corporation Lp, Houston, TX (US);

Inventors:

Vladimir Ilic, Diegem, BE;

Davor Brajanoski, Diegem, BE;

Volker Messinger, Diegem, BE;

Olivier Gomez, Grenoble, FR;

Ricardo Sengenberger, Diegem, BE;

Roman Orlov, Bratislava, SK;

Albert Martinez, Sant Cugat del Valles, ES;

Jaroslav Furka, Bratislava, SK;

Marek Morvai, Bratislava, SK;

Marek Horvath, Bratislava, SK;

Peter Kluvanec, Bratislava, SK;

Juraj Smetana, Bratislava, SK;

Michael J. Brandon, Marietta, GA (US);

Pablo Macaya, Sant Cugat del Valles, ES;

Juan Jeronimo Cabello, Sant Cugat del Valles, ES;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/177 (2006.01); H04L 12/24 (2006.01); G06F 16/35 (2019.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 41/0816 (2013.01); G06F 16/353 (2019.01); H04L 41/082 (2013.01); H04L 43/16 (2013.01);
Abstract

Event clusters can in an example embodiment include converting a description of an event associated with a configuration item (CI) to a standardized description, classifying the event based on a comparison of the standardized description of the event with a standardized description of a prior event included in an existing event cluster, and assigning the classified event to an event cluster.


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