The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2020

Filed:

Nov. 15, 2019
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Jawaharlal Tangudu, Bengaluru, IN;

Sashidharan Venkatraman, Bengaluru, IN;

Sarma Sundareswara Gunturi, Bengaluru, IN;

Chandrasekhar Sriram, Chennai, IN;

Sthanunathan Ramakrishnan, Bengaluru, IN;

Ram Narayan Krishna Nama Mony, Kanyakumari, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H03H 7/30 (2006.01); H03H 7/40 (2006.01); H03K 5/159 (2006.01); H04L 25/02 (2006.01); H04B 1/02 (2006.01); H04B 17/11 (2015.01);
U.S. Cl.
CPC ...
H04L 25/0202 (2013.01); H04B 1/02 (2013.01); H04B 17/11 (2015.01);
Abstract

A channel estimation method and system for IQ imbalance and local oscillator leakage correction, wherein an example of a channel estimation system comprising a calibrating signal generator configured to generate at least one pair of calibrating signals, a feedback IQ mismatch estimator configured to measure feedback IQ mismatch estimates based on the pair of calibrating signals, and a calibrating signal based channel estimator configured to generate a channel estimate based on the pair of calibrating signals and the feedback IQ mismatch estimates.


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