The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2020
Filed:
Dec. 31, 2019
National Chiao Tung University, Hsinchu, TW;
Ta-Sung Lee, Hsinchu, TW;
Chia-Hung Lin, Tainan, TW;
Yu-Chien Lin, New Taipei, TW;
Yi-Wei Chen, Hsinchu, TW;
NATIONAL CHIAO TUNG UNIVERSITY, Hsinchu, TW;
Abstract
An antenna performance evaluation method is disclosed. The method includes the following steps: measuring plurality of throughput values of the to-be-tested antenna at the first angle under different average radiation signal-to-interference ratio (SIR). The average radiation SIR and throughput values are fitted to output the first fitted curve. The second throughput value is measured at a certain average radiation SIR of the second angle of the to-be-tested antenna. Calculating a difference value between the first throughput value and the second throughput value corresponding to the same average radiation SIR, and the difference value and the first fitting curve constitute the transition second fitting curve. Selecting different average radiation SIR is repeatedly, and measure the corresponding second throughput value, and the corresponding difference value is calculated to update the transition second fitting curve. When the difference value is lower than the preset error range, the final second fitting curve is outputted.