The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2020

Filed:

Feb. 15, 2019
Applicant:

Viavi Solutions Inc., San Jose, CA (US);

Inventor:

Georg Rudolph, Tübingen, DE;

Assignee:

VIAVI SOLUTIONS INC., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/07 (2013.01); H04B 10/079 (2013.01); H04J 14/06 (2006.01); H04B 10/60 (2013.01);
U.S. Cl.
CPC ...
H04B 10/07953 (2013.01); H04B 10/07955 (2013.01); H04J 14/06 (2013.01); H04B 10/07 (2013.01); H04B 10/60 (2013.01);
Abstract

An apparatus for mitigating polarization dependent loss (PDL) in an optical signal-to-noise ratio (OSNR) of a modulated optical signal is disclosed. The apparatus may comprise a spectrum analyzer to measure an optical power spectrum of a modulated optical signal. The apparatus may also comprise a measuring unit to select a first portion of the modulated optical signal and a second portion of the modulated optical signal, where each of the first and second portions of the modulated optical signals may include an independent noise distribution indicative of PDL, and measure a time-varying parameter of the first and second portions. The apparatus may also include a signal processor to PDL in an OSNR by transforming any elliptical polarization associated with the independent noise distribution into a ball polarization, determining a correlation between time-varying parameters of the first and second portions, and calculating a PDL mitigated OSNR.


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