The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2020
Filed:
Mar. 28, 2018
Huawei Technologies Co., Ltd., Shenzhen, CN;
Dawei Wang, Munich, DE;
HUAWEI TECHNOLOGIES CO., LTD., Shenzhen, CN;
Abstract
An optical signal measurement method includes: measuring a power pof a first optical signal on a target frequency band at a moment Ti, and measuring a power qof a second optical signal on the target frequency band at a moment Ti+Δt, where the first optical signal is a signal detected in an optical signal transmission source, the second optical signal is a signal detected on a to-be-measured node, and Δt is a transmission duration of transmitting an optical signal from the optical signal transmission source to the to-be-measured node. The method further includes determining an optical signal-to-noise ratio on the to-be-measured node based on a power array P=[p, p] of the first optical signal on the target frequency band and a power array Q=[q, q] of the second optical signal on the target frequency band.