The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2020
Filed:
Sep. 04, 2018
Applicant:
Electronics and Telecommunications Research Institute, Daejeon, KR;
Inventors:
Kap Kee Kim, Daejeon, KR;
Il Kyu Park, Daejeon, KR;
Chang Joon Park, Daejeon, KR;
Jin Sung Choi, Daejeon, KR;
Assignee:
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE, Daejeon, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/47 (2006.01); B29C 64/386 (2017.01); B33Y 50/00 (2015.01); G06T 17/20 (2006.01);
U.S. Cl.
CPC ...
H03M 13/47 (2013.01); B29C 64/386 (2017.08); B33Y 50/00 (2014.12); G06T 17/20 (2013.01);
Abstract
Disclosed is a method of detecting and correcting an error in a 3D mesh model. According to the present disclosure, the method includes: determining at least one mesh on the basis of half-edge information; setting at least one cluster including the at least one mesh, on the basis of normal vector information on the at least one mesh; detecting a flip error of the at least one cluster; and correcting the at least one mesh in the at least one cluster in which the flip error is detected.