The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2020
Filed:
Jun. 17, 2019
Industry-university Cooperation Foundation Sogang University, Seoul, KR;
Kyu Man Cho, Seoul, KR;
Seung Hyun Yoon, Seoul, KR;
Wha-Keun Ahn, Andong-si, KR;
June Gyu Park, Seoul, KR;
Abstract
Provided is a plasma diagnosis system using multiple-path Thomson scattering, including: a laser which supplies laser pulse; an optical system which is configuring to focus alternately a vertical polarization of the laser pulse and a horizontal polarization of the laser pulse on first and second focal points in a plasma; a collection optic which collects lights scattered from the first and second focal points in plasma; a polychromator which filters the lights collected by the collection optics according to spectral characteristics; and a computer which measures spectral characteristics by using the filtered lights. Thomson scattered light which is contaminated with noise due to stray lights is produced in the first collected scattering while the noise due to stray lights is produced in the second collected scattering.