The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2020

Filed:

Mar. 14, 2017
Applicant:

Adobe Inc., San Jose, CA (US);

Inventors:

Radomir Mech, Mountain View, CA (US);

Ning Yu, Charlottesville, VA (US);

Xiaohui Shen, San Jose, CA (US);

Zhe Lin, Fremont, CA (US);

Assignee:

Adobe Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06N 3/08 (2006.01); G06N 3/04 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06N 3/0454 (2013.01); G06N 3/08 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30168 (2013.01);
Abstract

Digital image defect identification and correction techniques are described. In one example, a digital medium environment is configured to identify and correct a digital image defect through identification of a defect in a digital image using machine learning. The identification includes generating a plurality of defect type scores using a plurality of defect type identification models, as part of machine learning, for a plurality of different defect types and determining the digital image includes the defect based on the generated plurality of defect type scores. A correction is generated for the identified defect and the digital image is output as included the generated correction.


Find Patent Forward Citations

Mech, Radomir. (2020). Digital image defect identification and correction (U.S. Patent No. 10810721). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10810721

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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