The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2020

Filed:

Dec. 31, 2018
Applicant:

Datalogic Ip Tech S.r.l., Lippo di Calderara di Reno, IT;

Inventors:

Luca Pattini, Bologna, IT;

Andrea Di Chele, Baranello, IT;

Assignee:

Datalogic IP Tech S.r.l., Lippo di Calderara di, IT;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 19/07 (2006.01); G06K 7/08 (2006.01);
U.S. Cl.
CPC ...
G06K 19/0717 (2013.01); G06K 7/086 (2013.01); G06K 19/0723 (2013.01);
Abstract

A sensor configured to detect and record measured conditions, such as temperature, pressure, volume, displacement, acceleration, and/or other measureable conditions. The sensor may incorporate radio frequency identification (RFID) components. The sensor may also incorporate micro-electro-mechanical devices and/or systems (MEMS) and/or nano-electro-mechanical devices and/or systems (NEMS) that are configured to change in response to certain conditions encountered by the MEMS/NEMS and provide indications of the same. The sensor may include a detector configured to detect the changes in the MEMS/NEMS. The detected changes may be stored by the MEMS and/or the NEMS and/or the RFID components, allowing information about the changes to be retrieved through a RFID reading and/or scanning process. The sensor may be used to monitor and/or track conditions associated with certain objects and/or environments, among other uses.


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