The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2020

Filed:

Nov. 02, 2016
Applicant:

Hitachi Automotive Systems, Ltd., Ibaraki, JP;

Inventors:

Yasuhiro Ito, Tokyo, JP;

Yasuo Sugure, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01); G06F 11/26 (2006.01); G06F 30/20 (2020.01); G01M 17/007 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3664 (2013.01); G01M 17/007 (2013.01); G05B 23/0205 (2013.01); G06F 11/261 (2013.01); G06F 11/3668 (2013.01); G06F 11/3684 (2013.01); G06F 30/20 (2020.01); G05B 23/0256 (2013.01);
Abstract

A processor acquires a plurality of test items for a simulation model of a target system, each test item including at least one event; detects a set of test items from the plurality of test items under an aggregation condition in which an event in the set is not dependent on an event in another test item in the set; includes a common event, which is an event in the set that is the same as an event in another test item in the set, in an aggregate test item while avoiding overlapping of the common event, and includes a unique event, which is an event in the set that differs from events in other test items in the set, in the aggregate test item; and executes a simulation using the simulation model in accordance with the aggregate test item.


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