The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2020

Filed:

Jun. 21, 2018
Applicant:

Arm Limited, Cambridge, GB;

Inventors:

Milosch Meriac, Cambridge, GB;

Xabier Iturbe, Cambridge, GB;

Emre Ozer, Buckden, GB;

Balaji Venu, Cambridge, GB;

Shidhartha Das, Upper Cambourne, GB;

Assignee:

Arm Limited, Cambridge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/20 (2006.01); G06F 11/16 (2006.01); G06F 11/14 (2006.01); G06F 11/30 (2006.01); G06F 21/50 (2013.01);
U.S. Cl.
CPC ...
G06F 11/202 (2013.01); G06F 11/1441 (2013.01); G06F 11/1629 (2013.01); G06F 11/3058 (2013.01); G06F 21/50 (2013.01);
Abstract

Examples of the present disclosure relate to a method for anomaly response in a system on chip. The method comprises measuring a magnitude of a transient anomaly event in an operating condition of the system on chip. Based on the magnitude it is determined, for each of a plurality of components of the system on chip, an indication of susceptibility of that component to an anomaly event of the measured magnitude. Based on the determined indications of susceptibility for each of the plurality of components, an anomaly response action is determined. The method then comprises performing the anomaly response action.


Find Patent Forward Citations

Loading…