The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2020
Filed:
Oct. 23, 2017
Liebherr-werk Nenzing Gmbh, Nenzing, AT;
LIEBHERR-WERK NENZING GMBH, Nenzing, AT;
Abstract
A method for evaluation of faulty behavior of at least one event-data-generating machine including a data logging device for providing event data, comprising: transferring logged event data, the logged event data representing a sequence of events, from the event-data-generating machines to a central processor, mining multi-dimensional sequential patterns and/or mining multi-dimensional sequential rules and/or mining anomalies and/or exceptions within the transferred event data wherein the event data additionally comprises at least one dimensional attribute holding information indicating the event-data-generating machine or at least one event-data-generating machine property; the difference between timestamps of first and last events included in an identified sequential pattern and/or sequential rule and/or anomaly and/or exception may not exceed a predefined time window; and storing at least one reference sequential pattern, sequential rule and/or anomaly and/or exception as an output of the mined multi-dimensional sequential patterns and/or sequential rules, and/or anomalies and/or exceptions in a central database.