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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10809936 B1

PDFFull Text
Date of Patent:
Oct. 20, 2020

Filed:

Jul. 30, 2019

Utilizing machine learning to detect events impacting performance of workloads running on storage systems

Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Vibhor Kaushik, Shrewsbury, MA (US);

Zachary W. Arnold, Concord, MA (US);

Assignee:

EMC IP Holding Company LLC, Hopkinton, MA (US);

Attorney:

Ryan, Mason & Lewis, LLP

Primary Examiner:

Jae U Yu

Int. Cl.
CPC ...
G06F 3/06 (2006.01); G06F 11/34 (2006.01); G06N 20/00 (2019.01); G06N 3/04 (2006.01); G06F 17/15 (2006.01); G06K 9/62 (2006.01); G06N 5/04 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0647 (2013.01); G06F 3/067 (2013.01); G06F 3/0617 (2013.01); G06F 11/3485 (2013.01); G06F 17/15 (2013.01); G06K 9/6267 (2013.01); G06N 3/04 (2013.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01);
Abstract

A method includes monitoring a given workload running on one or more storage systems to obtain performance data, detecting a given potential performance-impacting event affecting the given workload based at least in part on a given portion of the obtained performance data, and generating a visualization of at least the given portion of the obtained performance data. The method also includes providing the generated visualization as input to a machine learning algorithm, utilizing the machine learning algorithm to classify the given potential performance-impacting event as one of (i) a true positive event affecting performance of the given workload and (ii) a false positive event corresponding to one or more changes in storage resource utilization by the given workload, and modifying provisioning of storage resources of the one or more storage systems responsive to classifying the given potential performance-impacting event as a true positive event affecting performance of the given workload.

Find Patent Forward Citations

Kaushik, Vibhor. (2020). Utilizing machine learning to detect events impacting performance of workloads running on storage systems (U.S. Patent No. 10809936). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10809936

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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