The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2020
Filed:
Jul. 28, 2019
Eric Swanson, Gloucester, MA (US);
Ofs Fitel, Llc, Norcross, GA (US);
Eric Swanson, Gloucester, MA (US);
Tristan Kremp, Somerset, NJ (US);
Paul S. Westbrook, Basking Ridge, NJ (US);
David DiGiovanni, Mountain Lakes, NJ (US);
Other;
OFS Fitel, LLC, Norcross, GA (US);
Abstract
An optical probe includes an optical source that generates an optical beam that propagates from a proximal end to a distal end of an optical fiber that imparts a transformation of a spatial profile of the optical beam. An optical control device imparts a compensating spatial profile on the optical beam that at least partially compensates for the transformation of the spatial profile of the optical beam imparted by the optical fiber in response to a control signal from a signal processor. A distal optical source generates a calibration light that propagates through the one or more optical waveguides from the distal end to the proximal end of the optical fiber. An optical detector detects the calibration light and generates electrical signals in response to the detected calibration light. The signal processor generates the control signal to instruct the optical control device to impart the compensating spatial profile on the optical beam that at least partially compensates for the transformation of the spatial profile of the optical beam imparted by the optical fiber.