The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2020
Filed:
Jun. 28, 2017
Honeywell Limited, Mississauga, CA;
Qiugang Lu, Vancouver, CA;
R. Bhushan Gopaluni, Vancouver, CA;
Michael G. Forbes, North Vancouver, CA;
Philip D. Loewen, North Vancouver, CA;
Johan U. Backstrom, North Vancouver, CA;
Guy A. Dumont, Vancouver, CA;
Honeywell Limited, Mississauga, CA;
Abstract
A method includes repeatedly identifying one or more values for one or more model parameters of at least one model associated with a process. The one or more values for the one or more model parameters are identified using data associated with the process. The method also includes clustering the values of the one or more model parameters into one or more clusters. The method further includes identifying one or more additional values for the one or more model parameters using additional data associated with the process. In addition, the method includes detecting a mismatch between the at least one model and the process in response to determining that at least some of the one or more additional values fall outside of the one or more clusters. The values could be clustered using a support vector machine.