The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2020
Filed:
Aug. 15, 2017
Hamamatsu Photonics K.k., Hamamatsu-shi, Shizuoka, JP;
Satoshi Yamamoto, Hamamatsu, JP;
Masanori Matsubara, Hamamatsu, JP;
Norikazu Sugiyama, Hamamatsu, JP;
HAMAMATSU PHOTONICS K.K., Hamamatsu-shi, Shizuoka, JP;
Abstract
A sample observation device () includes: an emission optical system () for emitting planar light (L) onto a sample (S); a scanning unit () for scanning the sample (S) with respect to an emission face (R) of the planar light (L); an imaging optical system () having an observation axis (P) inclined with respect to the emission face (R) and for forming an image from observation light (L) generated in the sample (S) in accordance with the emission of the planar light (L); an image acquiring unit () for acquiring a plurality of partial image data corresponding to a part of an optical image according to the observation light (L) formed as an image by the imaging optical system (); and an image generating unit () for generating observation image data of the sample S based on the plurality of partial image data generated by the image acquiring unit ().