The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2020

Filed:

Jul. 04, 2016
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Ira Micah Blevis, Zichron Yaakov, IL;

Roger Steadman Booker, Aachen, DE;

Christoph Herrmann, Aachen, DE;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01); G01T 7/00 (2006.01);
U.S. Cl.
CPC ...
G01T 1/247 (2013.01); G01T 1/243 (2013.01); G01T 7/00 (2013.01);
Abstract

An imaging system () includes a detector module (). The detector module includes a block () of a plurality of direct conversion photon counting detector pixels () and corresponding electronics (or) with hardware for both high energy resolution imaging mode and high X-ray flux imaging mode connected with the block of the plurality of direct conversion photon counting detector pixels. A method includes identifying a scanning mode for a selected imaging protocol, wherein the scanning modes includes one of a higher energy resolution mode and a higher X-ray flux mode, configuring a detector module, which is configurable for both the higher energy resolution mode and the higher X-ray flux mode, based on the identified scanning mode, performing the scan with the detector module configured for the mode of the selected imaging protocol, and processing scan data from the scan, generating volumetric image data.


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