The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2020
Filed:
May. 22, 2018
Siemens Healthcare Gmbh, Erlangen, DE;
Stefan Meyer, Langensendelbach, DE;
SIEMENS HEALTHCARE GMBH, Eerlangen, DE;
Abstract
A method is for adapting a parameter of a parameter set for a magnetic resonance measurement of an examination object. An embodiment of the method includes choosing a parameter set required for the magnetic resonance measurement of the examination object; determining at least one interaction indicator applicable to an interaction between electromagnetic radiation and a tissue of the examination object; comparing the interaction indicator with a previously defined upper limit for the interaction indicator and, upon the upper limit being exceeded, determining a group of parameters from the parameter set, adaptable with a view to complying with the upper limit. The method further includes calculating a modification suggestion for a multiplicity of parameters from the group with a view to complying with the upper limit, identifying a parameter to optimize a quality parameter of the magnetic resonance measurement, and adapting the identified parameter in accordance with its modification suggestion.