The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2020

Filed:

Nov. 28, 2017
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventor:

Joachim Danz, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/302 (2006.01); G01R 31/307 (2006.01); G01R 31/317 (2006.01); G01R 31/28 (2006.01); H04B 17/29 (2015.01);
U.S. Cl.
CPC ...
G01R 31/3025 (2013.01); G01R 31/2841 (2013.01); G01R 31/307 (2013.01); G01R 31/317 (2013.01); H04B 17/29 (2015.01);
Abstract

An over-the-air test system is described that is used for testing a device under test in a wireless communication environment. The test system comprises at least one measurement antenna connected with a signal processing unit configured to generate a signal or to analyze a signal. The test system further comprises a reflector configured to reflect electromagnetic signals, the reflector being positioned in a signal path established between the device under test and the measurement antenna such that the signals are reflected by the reflector. The measurement antenna has a radiation pattern with a main lobe, the measurement antenna being configured to adjust the direction of the main lobe with respect to the reflector in order to simulate different impinging angles of the signals. Further, a method for testing a device under test is described.


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