The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2020
Filed:
Nov. 18, 2019
The Boeing Company, Chicago, IL (US);
Hong Hue Tat, Redmond, WA (US);
Kelly M. Greene, Kent, WA (US);
John Z. Lin, Renton, WA (US);
Carlyn R. Brewer, Newcastle, WA (US);
Russell Lee Keller, Maple Valley, WA (US);
THE BOEING COMPANY, Chicago, IL (US);
Abstract
A method for analyzing a structure includes processing nondestructive inspection (NDI) data for a multi-layer structure to define areas of inconsistency at an internal layer or an interface between adjacent layers. The method includes mapping the areas of inconsistency to finite elements of a finite element model of a nominal of the structure. These finite elements are thereby identified as affected finite elements and include finite elements for the affected internal layer or interface. The method includes producing a reconstructed finite element model of the affected structure from the nominal finite element model, and a modified property or state value assigned to respective element datasets of the affected finite elements. The method includes performing a finite element method (FEM) failure analysis of the reconstructed finite element model under a load, which indicates an extent of residual integrity of the affected structure.