The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2020
Filed:
Sep. 06, 2017
Applicant:
Shimadzu Corporation, Kyoto, JP;
Inventors:
Assignee:
Shimadzu Corporation, Nishinokyo-Kuwabaracho, Nakagyo-ku, Kyoto-shi, Kyoto, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/20 (2018.01); G01N 23/20025 (2018.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/20025 (2013.01); A61B 6/00 (2013.01); G01N 23/20 (2013.01); G01N 23/20075 (2013.01); G01N 2223/3303 (2013.01); G01N 2223/3307 (2013.01); G01N 2223/618 (2013.01);
Abstract
This X-ray phase imaging apparatus () includes a controller () that generates a dark field image (Iv) with respect to each of a plurality of relative positions between a subject (S) and an imaging grating (G) changed by an adjustment mechanism () to acquire a contrast of a region of interest (ROI) in the dark field image (Iv), and controls the adjustment mechanism () to adjust a relative position between the subject (S) and the imaging grating (G) based on the acquired contrast.