The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2020
Filed:
Dec. 20, 2016
Koninklijke Philips N.v., Eindhoven, NL;
Ganeshram Krishnamoorthy, Eindhoven, NL;
Joukje Garrelina Orsel, Valkenswaard, NL;
Johannes Joseph Hubertina Barbara Schleipen, Eindhoven, NL;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
A sensor platform () with a sensor surface () receives particles (). A material extending from the sensor surface () having a refractive index higher than the one of the fluid (), such that an electromagnetic wave () propagating in this platform material () and incident to the sensor surface () at an angle greater than the critical optical angle is totally reflected onto the sensor surface (). The particles () suspended in the fluid () include a metallic material () enabling a localized surface plasmon resonance at resonant wavelength(s). An optical detector () detects a portion of a spectrum of the totally reflected wave (), including the resonant wavelength(s). A processor determines a presence of the particles () on or close to the sensor surface () from a frustrated totally internal reflection ('FTIR') signal retrieved from the detected wavelengths. The retrieving takes into account the detected resonant component(s) present in the FTIR signal.