The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2020

Filed:

Feb. 02, 2018
Applicant:

Jvc Kenwood Corporation, Yokohama-shi, Kanagawa, JP;

Inventors:

Shigehiko Iwama, Yokohama, JP;

Masahiro Yamamoto, Yokohama, JP;

Atsushi Saito, Yokohama, JP;

Assignee:

JVC KENWOOD CORPORATION, Yokohama-Shi, Kanagawa, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01); G01N 15/14 (2006.01); G01N 35/00 (2006.01); G01N 33/543 (2006.01); G01N 33/567 (2006.01); G01N 33/48 (2006.01); G01N 33/50 (2006.01); G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1456 (2013.01); B01L 3/508 (2013.01); G01N 35/00069 (2013.01); B01L 2200/0647 (2013.01); B01L 2300/0803 (2013.01); G01N 33/48 (2013.01); G01N 33/50 (2013.01); G01N 33/53 (2013.01); G01N 33/543 (2013.01); G01N 33/54366 (2013.01); G01N 33/567 (2013.01); G01N 35/00613 (2013.01); G01N 2015/1486 (2013.01);
Abstract

An analysis device includes a turntable, an optical pickup, and a controller. The turntable holds a disc for specimen analysis having a reaction region on which fine particles binding to substances to be detected are captured per track. The optical pickup emits laser light to the reaction region, receives a reflected light from the reaction region, and generates a reception level signal of the light. The controller sequentially generates a plurality of measurement gate signals per track for counting the number of the fine particles captured on the reaction region, counts the number of the fine particles per measurement gate signal from the reception level signal, compares measurement results obtained in positions having a symmetric relation with each other in the reaction region, and defines a measurement-result-correction target region for correcting the number of the fine particles.


Find Patent Forward Citations

Iwama, Shigehiko. (2020). Analysis device and analysis method (U.S. Patent No. 10809178). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10809178

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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