The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2020

Filed:

Aug. 27, 2019
Applicant:

Ciena Corporation, Hanover, MD (US);

Inventors:

Andrew D. Shiner, Ottawa, CA;

Michael Andrew Reimer, Stittsville, CA;

Maurice O'Sullivan, Ottawa, CA;

Assignee:

Ciena Corporation, Hanover, MD (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01M 11/00 (2006.01);
U.S. Cl.
CPC ...
G01M 11/33 (2013.01);
Abstract

Systems and method include a detector communicatively coupled to a fiber span; and processing circuitry connected to the detector and configured to digitally sample and process an output of the detector, detect phase changes in the output, and identify an electrostrictive response of the fiber span based on the detected phase changes and based on a dependence of the detected phase changes with frequency. A property of the fiber span can be determined on the electrostrictive response. The property of the optical fiber can include one or more of optical fiber material type, optical fiber material property, optical fiber area, optical fiber geometry, optical fiber condition, optical fiber stress and strain, optical fiber temperature. and optical fiber radiation exposure.


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