The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2020

Filed:

Apr. 05, 2019
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Youngzoon Yoon, Hwaseong-si, KR;

Hyochul Kim, Yongin-si, KR;

Younggeun Roh, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/02 (2006.01); A61B 5/1455 (2006.01); A61B 5/145 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/0205 (2013.01); A61B 5/1455 (2013.01); A61B 5/14532 (2013.01); G01J 2003/2826 (2013.01); G01J 2003/2833 (2013.01);
Abstract

An apparatus for analyzing spectral information includes a database configured to store spectral information of a plurality of materials analyzed by the apparatus, a spectroscopic unit configured to generate spectral information of a subject by filtering an optical signal received from the subject in units of wavelengths, and a controller configured to obtain correlations between spectral information of each of candidate materials from among the plurality of materials and the spectral information of the subject, and generate result information based on the correlations.


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