The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2020

Filed:

Feb. 28, 2017
Applicant:

Chuo Hatsujo Kabushiki Kaisha, Aichi, JP;

Inventor:

Hideyo Takeuchi, Aichi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G06T 7/00 (2017.01); G06T 7/13 (2017.01); G01B 21/20 (2006.01); G01B 11/26 (2006.01);
U.S. Cl.
CPC ...
G01B 11/24 (2013.01); G01B 11/26 (2013.01); G01B 21/20 (2013.01); G06T 7/0006 (2013.01); G06T 7/13 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/20056 (2013.01); G06T 2207/30164 (2013.01);
Abstract

Provided is a shape measurement device that measures a shape of a spiral spring formed in a spiral shape. The shape measurement device is provided with an input means and a function calculation means. The input means inputs a captured photographic image depicting the spiral spring or measurement data produced by measuring the shape of the spiral spring. The function calculation means uses the input photographic image or measurement data to calculate at least an inter-coil space function representing the space between neighboring coils of the spiral spring, a pitch function representing the distance between coil cores of neighboring coils of the spiral spring, or a coil thickness function representing the thickness of coils of the spiral spring.


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