The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2020
Filed:
Sep. 01, 2017
Applicant:
Northrop Grumman Innovation Systems, Inc., Plymouth, MN (US);
Inventors:
Nathan T. Green, Holladay, UT (US);
James Scott, Beavercreek, OH (US);
Cameron D. Gould, South Ogden, UT (US);
Assignee:
Northrop Grumman Innovation Systems, Inc., Plymouth, MN (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 22/02 (2006.01); D06H 3/14 (2006.01);
U.S. Cl.
CPC ...
D06H 3/14 (2013.01); G01N 22/02 (2013.01);
Abstract
A defect detection system comprises a movement assembly and a sensor assembly. The movement assembly is configured and positioned to hold and move a substantially non-conductive structure. The sensor assembly comprises at least one radar device configured and positioned to detect conductive debris in the substantially non-conductive structure as portions of the substantially non-conductive structure move therepast. A defect detection method and a processing a composite structure are also described.