The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2020

Filed:

Sep. 19, 2017
Applicant:

Ipg Photonics Corporation, Oxford, MA (US);

Inventors:

Jeffrey P. Sercel, Hollis, NH (US);

Marco Mendes, Manchester, NH (US);

Rouzbeh Sarrafi, Fremont, NH (US);

Joshua Schoenly, Nashua, NH (US);

Xiangyang Song, Acton, MA (US);

Mathew Hannon, Bedford, NH (US);

Miroslaw Sokol, Bedford, NH (US);

Assignee:

IPG PHOTONICS CORPORATION, Oxford, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/40 (2014.01); B23K 26/06 (2014.01); B23K 26/08 (2014.01); B23K 26/402 (2014.01); B23K 26/38 (2014.01); B23K 26/0622 (2014.01); B23K 26/361 (2014.01); B23K 26/082 (2014.01); B23K 26/70 (2014.01); C03B 33/02 (2006.01); B23K 103/00 (2006.01);
U.S. Cl.
CPC ...
B23K 26/402 (2013.01); B23K 26/0613 (2013.01); B23K 26/0624 (2015.10); B23K 26/082 (2015.10); B23K 26/0853 (2013.01); B23K 26/0876 (2013.01); B23K 26/361 (2015.10); B23K 26/38 (2013.01); B23K 26/70 (2015.10); C03B 33/0222 (2013.01); B23K 2103/50 (2018.08); B23K 2103/52 (2018.08); B23K 2103/54 (2018.08); Y02P 40/57 (2015.11);
Abstract

Laser processing of hard dielectric materials may include cutting a part from a hard dielectric material using a continuous wave laser operating in a quasi-continuous wave (QCW) mode to emit consecutive laser light pulses in a wavelength range of about 1060 nm to 1070 nm. Cutting using a QCW laser may be performed with a lower duty cycle (e.g., between about 1% and 15%) and in an inert gas atmosphere such as nitrogen, argon or helium. Laser processing of hard dielectric materials may further include post-cut processing the cut edges of the part cut from the dielectric material, for example, by beveling and/or polishing the edges to reduce edge defects. The post-cut processing may be performed using a laser beam with different laser parameters than the beam used for cutting, for example, by using a shorter wavelength (e.g., 193 nm excimer laser) and/or a shorter pulse width (e.g., picosecond laser).


Find Patent Forward Citations

Loading…