The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2020
Filed:
Aug. 24, 2016
Applicant:
Arcam Ab, Moelndal, SE;
Inventors:
Johan Backlund, Onsala, SE;
Martin Wildheim, Moelndal, SE;
Assignee:
Arcam AB, Moelndal, SE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 15/00 (2006.01); G01T 1/29 (2006.01); B29C 64/20 (2017.01); B29C 64/153 (2017.01); B33Y 50/00 (2015.01); H01J 37/305 (2006.01); B22F 3/105 (2006.01); B33Y 10/00 (2015.01); B33Y 40/00 (2020.01); B33Y 50/02 (2015.01); H01J 37/30 (2006.01);
U.S. Cl.
CPC ...
B23K 15/0013 (2013.01); B23K 15/002 (2013.01); B23K 15/0086 (2013.01); B29C 64/153 (2017.08); B29C 64/20 (2017.08); B33Y 50/00 (2014.12); G01T 1/29 (2013.01); H01J 37/305 (2013.01); B22F 3/1055 (2013.01); B33Y 10/00 (2014.12); B33Y 40/00 (2014.12); B33Y 50/02 (2014.12); H01J 37/3002 (2013.01); H01J 2237/2445 (2013.01); H01J 2237/30433 (2013.01); H01J 2237/30472 (2013.01); Y02P 10/295 (2015.11);
Abstract
An X-ray standard reference object for calibrating a scanning electron beam in an additive manufacturing apparatus by measuring X-ray signals generated by scanning the electron beam onto the reference object, the reference object comprises: a lower and an upper plate being essentially in parallel and attached spaced apart from each other, the upper plate comprises a plurality of holes, wherein a predetermined hollow pattern is provided inside the holes.