The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2020
Filed:
Apr. 26, 2018
Omron Corporation, Kyoto, JP;
Toyoo Iida, Nagaokakyo, JP;
Yuki Taniyasu, Ritto, JP;
OMRON Corporation, Kyoto, JP;
Abstract
An image processing system (SYS) specifies an arrangement situation of a workpiece (W) provided by a line (L). The image processing system (SYS) specifies a normal (V) with respect to a set measurement point (Wp) of the workpiece (W) according to the specified arrangement situation of the workpiece (W), and changes a position and posture of the two-dimensional camera () so that the specified normal (V) matches an optical axis of the two-dimensional camera () (S). The image processing system (SYS) changes a distance between the two-dimensional camera () and the measurement point (Wp) so that the specified normal (V) matches the optical axis of the two-dimensional camera (), to focus the two-dimensional camera () on the measurement point (Wp).