The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2020

Filed:

Jul. 06, 2016
Applicant:

Hitachi Automotive Systems, Ltd., Hitachinaka-shi, Ibaraki, JP;

Inventors:

Ryoichi Inada, Tokyo, JP;

Teppei Hirotsu, Tokyo, JP;

Hideyuki Sakamoto, Hitachinaka, JP;

Kouichi Yahata, Hitachinaka, JP;

Keiji Kadota, Hitachinaka, JP;

Assignee:

Hitachi Automotive Systems, Ltd., Hitachinaka-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K 17/082 (2006.01); H02M 1/32 (2007.01); G01R 31/327 (2006.01); G01R 35/00 (2006.01); H03K 17/08 (2006.01); H02M 1/08 (2006.01); H02M 1/084 (2006.01); G01R 31/42 (2006.01); H02H 7/122 (2006.01);
U.S. Cl.
CPC ...
H03K 17/0822 (2013.01); G01R 31/3277 (2013.01); G01R 35/00 (2013.01); H02M 1/08 (2013.01); H02M 1/32 (2013.01); H03K 17/0828 (2013.01); G01R 31/42 (2013.01); H02H 7/122 (2013.01); H02M 1/084 (2013.01); H02M 2001/322 (2013.01); H02M 2001/327 (2013.01); H03K 2017/0806 (2013.01); H03K 2217/0081 (2013.01);
Abstract

An object of the present invention is to diagnose an abnormality detecting circuit that detects an abnormality, such as an overcurrent of a power semiconductor, with the number of insulating elements to be additionally provided, inhibited from increasing. There are provided: a drive circuit configured to output a gate signal to a power semiconductor; an abnormality detecting circuit configured to detect an abnormality of the power semiconductor; and a diagnosis signal applying circuit configured to apply a diagnosis signal to the abnormality detecting circuit. The diagnosis signal applying circuit applies the diagnosis signal, on the basis of the gate signal output by the drive circuit.


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