The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2020

Filed:

Mar. 30, 2012
Applicants:

Karl David Schuh, Santa Cruz, CA (US);

Karl Huan-yao Ko, Sunnyvale, CA (US);

Aloysius C. Ashley Wijeyeratnam, Newark, CA (US);

Steven Gaskill, Campbell, CA (US);

Thad Omura, Los Altos, CA (US);

Sumit Puri, Fremont, CA (US);

Jeremy Isaac Nathaniel Werner, San Jose, CA (US);

Inventors:

Karl David Schuh, Santa Cruz, CA (US);

Karl Huan-Yao Ko, Sunnyvale, CA (US);

Aloysius C. Ashley Wijeyeratnam, Newark, CA (US);

Steven Gaskill, Campbell, CA (US);

Thad Omura, Los Altos, CA (US);

Sumit Puri, Fremont, CA (US);

Jeremy Isaac Nathaniel Werner, San Jose, CA (US);

Assignee:

Seagate Technology LLC, Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/08 (2006.01); G11C 29/16 (2006.01); G11C 29/26 (2006.01); G06F 9/44 (2018.01); G11C 29/44 (2006.01); G11C 29/06 (2006.01); G11C 29/04 (2006.01); G11C 16/00 (2006.01);
U.S. Cl.
CPC ...
G11C 29/08 (2013.01); G06F 9/44 (2013.01); G11C 29/16 (2013.01); G11C 29/26 (2013.01); G11C 16/00 (2013.01); G11C 29/06 (2013.01); G11C 29/44 (2013.01); G11C 2029/0407 (2013.01);
Abstract

A Solid-State Disk (SSD) Manufacturing Self Test (MST) capability enables an SSD manufacturer to generate and load tests onto SSDs, run the tests, and gather results. The SSDs self execute the loaded tests when powered up. The self executing is while coupled to a host that loaded the tests or while coupled to a rack unable to load the tests but enabled to provide power to the SSDs. The rack is optionally cost-reduced to enable cost-efficient parallel testing of relatively larger numbers of SSDs for production. The host writes the tests to an 'input' SMART log of each SSD, and each SSD writes results to a respective included 'output' SMART log. The commands include write drive, erase drive, SATA PHY burn-in, delay, and stress mode. The SSD MST capability is optionally used in conjunction with an SSD virtual manufacturing model.


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