The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2020

Filed:

Sep. 19, 2019
Applicant:

Palantir Technologies Inc., Palo Alto, CA (US);

Inventors:

Alexandru Antihi, Palo Alto, CA (US);

Ari Gesher, Menlo Park, CA (US);

Assignee:

Palantir Technologies Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01); G06F 3/0481 (2013.01); G06F 3/0484 (2013.01);
U.S. Cl.
CPC ...
G06T 11/206 (2013.01); G06F 3/04812 (2013.01); G06F 3/04842 (2013.01);
Abstract

Systems and methods are provided for presenting multiple dimensions of an entity for visual comparison. Multiple sets of data representing multiple dimensions of a first entity may be accessed. The multiple sets of data may be converted for plotting within a first multidimensional arc chart. The first multidimensional arc chart may be defined by a rounded outer shape. The rounded outer shape may be characterized by an arc length. The first multidimensional arc chart may be divided into multiple sections. Individual sections may include a plot of a dimension of the first entity. Values of the plot may be determined based on corresponding positions along the arc length. An interface that includes the first multidimensional arc chart may be provided.


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