The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2020

Filed:

Sep. 29, 2015
Applicants:

Larisa V. Branets, Conroe, TX (US);

Xiaohui Wu, Sugar Land, TX (US);

Linfeng BI, Houston, TX (US);

Inventors:

Larisa V. Branets, Conroe, TX (US);

Xiaohui Wu, Sugar Land, TX (US);

Linfeng Bi, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 50/02 (2012.01); G06Q 10/06 (2012.01); G01V 99/00 (2009.01); G06T 17/20 (2006.01); G06F 30/20 (2020.01);
U.S. Cl.
CPC ...
G06Q 50/02 (2013.01); G01V 99/005 (2013.01); G06Q 10/067 (2013.01); G06T 17/205 (2013.01); G01V 2210/66 (2013.01); G06F 30/20 (2020.01);
Abstract

Method for mapping a 3D grid or mesh from a faulted subsurface domain to a continuous design domain, wherein the grid may be used to represent a discrete model of a subsurface material property (such as permeability) to use, for example, in a reservoir simulator. The mapping is geometry-based, not physics-based. The mapping is determined by an iterative optimization procedure designed to penalize deformation of tessellated mesh cells () in the design domain compared to their geometric quality in the faulted domain (), but subject to stitching constraints () appearing as a penalty term or Lagrange multiplier term in the optimization objective function to influence the final mesh to co-locate pairs of points identified on opposite sides of a fault as having been located together before the fault occurred.


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