The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2020

Filed:

Sep. 27, 2012
Applicant:

Adobe Inc., San Jose, CA (US);

Inventors:

David M. Weinstein, Rockville Centre, NY (US);

Matvey Kapilevich, New York, NY (US);

Harleen S. Sahni, Astoria, NY (US);

Margarita R. Savova, Jersey City, NJ (US);

Nicholas M. Jordan, Brooklyn, NY (US);

David A. Jared, Denver, CO (US);

Assignee:

Adobe Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/10 (2012.01); G06Q 30/02 (2012.01);
U.S. Cl.
CPC ...
G06Q 30/02 (2013.01);
Abstract

Selection of a trait may be received. A complex segment rule may be created that is usable to evaluate one or more qualification events. For example, the segment rule may be usable to evaluate a combined recency and frequency of the one or more qualification events. The qualification events may be based on collected network data associated with the plurality of visitors with each qualification event corresponding to a separate qualification of visitor according to the trait. The qualification events may be evaluated together according to the segment rule. For example, the combined recency and frequency of the one or more qualification events may be evaluated according to the segment rule. Evaluating the segment rule may include estimating a segment population size in real-time.


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