The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2020
Filed:
Feb. 26, 2018
Fujifilm Corporation, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
An inspection specifying unit acquires structure information of a building that is an inspection target. Use environment history information of the building that is an inspection target is acquired. The inspection specifying unit specifies a member position that is an inspection target and a type of damage that is an inspection target at the member position on the basis of the structure information of the building and the use environment history information. An inspection data acquisition unit acquires inspection data including image data obtained by imaging a subject image of each member and position information of each member. An inspection data analysis unit acquires the image data corresponding to the member position from the inspection data acquisition unit, analyzes the image data, and determines whether there is damage of the damage type specified as the inspection target, and a degree of damage in a case where there is the damage.