The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2020

Filed:

Jan. 04, 2018
Applicant:

Shutterfly, Inc., Redwood City, CA (US);

Inventor:
Assignee:

Shutterfly, LLC, Redwood City, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06F 17/16 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00288 (2013.01); G06F 17/16 (2013.01); G06K 9/00677 (2013.01); G06K 9/6256 (2013.01); G06K 9/6269 (2013.01);
Abstract

A computer-implemented method includes selecting a kernel and kernel parameters for a first Support Vector Machine (SVM) model, testing the first SVM model on a feature matrix T of n feature vectors of length m to produce false positive (FP) data set and false negative (FN) data set by a computer processor, wherein n and m are integer numbers, automatically removing feature vectors corresponding to the FN data set from the feature matrix T by the computer processor to produce a feature matrix T_best of size (n-size(FN))*m, retraining the first SVM model on the feature matrix T_best to produce a second SVM model, and checking if a ratio (T_best sample number)/(SVM support vector number) is above a threshold for the second SVM model on T_best. If the ratio is above the threshold, SVM predictions is performed using the second SVM model on the feature matrix T_best.


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