The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2020
Filed:
Nov. 01, 2018
Fujitsu Component Limited, Tokyo, JP;
Koichiro Fuji, Tokyo, JP;
FUJITSU COMPONENT LIMITED, Tokyo, JP;
Abstract
A length measuring instrument for measuring length with a measure includes: a measure on which a code is printed, a plurality of patterns each allotted to a different number being arranged, each of the patterns having digits to which an N-notation number (N being 3 or greater) is allotted, each of the digits having a different color corresponding to the allotted numerical value, the patterns being arranged in ascending order or descending order, a Hamming distance between patterns adjacent to each other in an array direction being 1, an amount of change in numerical value at the same digit between the adjacent patterns being 1 in the code; a reading unit that optically reads patterns printed on the measure; and a measuring unit that measures a length of a measurement target from a result of the reading by the reading unit.