The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2020
Filed:
Jul. 30, 2018
International Business Machines Corporation, Armonk, NY (US);
Robert H. Grant, Atlanta, GA (US);
Trudy L. Hewitt, Cary, NC (US);
Brian A. O'Crowley, Dublin, IE;
Jonathan Dunne, Dungarvan, IE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
An approach is provided in which a system analyzes a first set of data to derive a first distribution output that is based on a first conjugated distribution corresponding to the first set of data and a domain class model. The system utilizes the first distribution output as a baseline input to generate a second conjugated distribution corresponding to a second set of data and the domain class model. Next, the system derives a second distribution output of the second set of data based on the second conjugated distribution. The second distribution output identifies at least one personally identifiable information (PII) data field corresponding to the second set of data that was not identified as a PII data field in the domain class model. In turn, the system tags at least a portion of the second set of data as PII based on the derived second distribution output.