The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2020

Filed:

Aug. 10, 2015
Applicant:

Hewlett Packard Enterprise Development Lp, Houston, TX (US);

Inventors:

Alina Maor, Haifa, IL;

Renato Keshet, Haifa, IL;

Ron Maurer, Haifa, IL;

Yaniv Sabo, Haifa, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 16/2458 (2019.01); G06F 16/28 (2019.01); G06F 21/00 (2013.01); G06F 21/55 (2013.01); G06N 7/00 (2006.01); G06N 20/00 (2019.01); G06F 16/2457 (2019.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G06F 16/2462 (2019.01); G06F 16/24578 (2019.01); G06F 16/285 (2019.01); G06F 16/288 (2019.01); G06F 17/18 (2013.01); G06F 21/00 (2013.01); G06F 21/552 (2013.01); G06N 7/005 (2013.01); G06N 20/00 (2019.01);
Abstract

The present disclosure provides a method, system and non-transient computer readable medium for evaluating system behaviour by deriving a statistical distance between each entity in a multi-entity system, and summing the statistical distance to each other entity to create a ranked abnormality score for each entity in the system.


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