The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2020
Filed:
Nov. 17, 2016
System and method for checking and characterizing snapshot metadata using snapshot metadata database
Applicant:
Vmware, Inc., Palo Alto, CA (US);
Inventors:
Cheng Li, Palo Alto, CA (US);
Li Ding, Cupertino, CA (US);
Bret Needle, Foster City, CA (US);
Mayank Rawat, Cupertino, CA (US);
Assignee:
VMware, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/00 (2019.01); G06F 11/14 (2006.01); G06F 16/11 (2019.01);
U.S. Cl.
CPC ...
G06F 11/1458 (2013.01); G06F 16/128 (2019.01); G06F 2201/815 (2013.01);
Abstract
System and method for checking and characterizing metadata of snapshots utilize a snapshot metadata database to execute at least one of checking and characterizing operations on the metadata of snapshots. The snapshot metadata database includes information extracted from backing storage elements containing the metadata of snapshots.
Li, Cheng. (2020). System and method for checking and characterizing snapshot metadata using snapshot metadata database (U.S. Patent No. 10802927). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10802927
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