The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2020

Filed:

Jan. 10, 2019
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Chun-Chieh Huang, Taoyuan, TW;

Tzu-Chia Wang, New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 11/20 (2006.01);
U.S. Cl.
CPC ...
G06F 11/0709 (2013.01); G06F 11/0757 (2013.01); G06F 11/2025 (2013.01);
Abstract

A compute node, a failure detection method thereof and a cloud data processing system are provided. The method is adapted to the cloud data processing system having a plurality of compute nodes and at least one management node, and includes following steps: performing a self-inspection on operating statuses of services being provided and resource usage statuses, and reporting an inspection result to the management node by each compute node; dynamically adjusting a time interval of a next report and informing the management node of the time interval by the compute node; and checking a report condition of the inspection result according to the time interval by the management node, so as to determine whether the compute node fails.


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