The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2020
Filed:
Sep. 17, 2018
Fanuc Corporation, Yamanashi, JP;
Takaaki Fujii, Yamanashi, JP;
Zheng Tong, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
A machining condition selecting device includes a machining condition contribution data management unit configured to manage machining condition contribution data in which each of a plurality of machining conditions is associated with a 3-dimensional surface roughness parameter and degrees of contribution to each item of a required condition related to productivity of a target product; a matter of priority acquisition unit configured to acquire a combination of the 3-dimensional surface roughness parameter and at least one item of the required condition as a matter of priority; and a machining condition selection data management unit configured to manage, for each of the plurality of machining conditions, machining condition selection data in which a combination pattern of the matters of priority is associated with a sum of the degrees of contribution to each item in the combination pattern.