The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2020
Filed:
Apr. 28, 2015
Finisar Corporation, Sunnyvale, CA (US);
Christoph M. Greiner, Eugene, OR (US);
Thomas W. Mossberg, Eugene, OR (US);
Dmitri Iazikov, Eugene, OR (US);
II-VI Delaware Inc., Wilmington, DE (US);
Abstract
A diffraction grating comprises a substrate (with index n) with a surface facing an optical medium (with index n<n), a dielectric or semiconductor layer of thickness t on the substrate surface (with index n≠n), and a set of diffractive elements on the layer (with index n≠n). The diffractive elements comprise a set of ridges protruding into the optical medium, which fills trenches between the ridges, and are characterized by a spacing Λ, a width d, and a height h. Over an operational wavelength range, λ/2n<Λ<λ/(n+n). An optical signal incident on the diffractive elements from within the substrate at an incidence angle exceeding the critical angle, n, n, n, n, Λ, d, h, and t result in wavelength-dependent, first-order diffraction efficiency of the grating greater than a prescribed level over the operational wavelength range for both s- and p-polarized optical signals.