The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2020
Filed:
Jan. 20, 2016
Applicant:
Lg Electronics Inc., Seoul, KR;
Inventors:
Kilbom Lee, Seoul, KR;
Jiwon Kang, Seoul, KR;
Kitae Kim, Seoul, KR;
Kungmin Park, Seoul, KR;
Heejin Kim, Seoul, KR;
Assignee:
LG Electronics Inc., Seoul, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/10 (2006.01); G01S 13/50 (2006.01); H04L 25/03 (2006.01); H04L 27/26 (2006.01); H04J 11/00 (2006.01); H04W 72/12 (2009.01); H04W 84/02 (2009.01);
U.S. Cl.
CPC ...
G01S 13/505 (2013.01); H04J 11/00 (2013.01); H04L 25/03821 (2013.01); H04L 27/2657 (2013.01); H04W 72/1278 (2013.01); H04W 84/02 (2013.01); H04L 27/2676 (2013.01);
Abstract
Disclosed is a Doppler measurement method comprising: generating a first function defined by reception signals in two consecutive subcarriers for a specific OFDM symbol; generating a second function defined on the basis of the signs and sizes of a real part and an imaginary part of the first function; repeatedly performing a process of generating the first function and the second function for all of a set of OFDM symbols; and determining, as a Doppler value, the phase of a third function obtained by adding the results of repeatedly performing the process.