The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2020

Filed:

Feb. 05, 2018
Applicant:

Magnetrol International, Incorporated, Aurora, IL (US);

Inventors:

Christopher P. Turcotte, Brookfield, WI (US);

Steven R. Page, Naperville, IL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/292 (2006.01); G01F 23/00 (2006.01); G01S 13/10 (2006.01); G01F 23/284 (2006.01); G01S 13/522 (2006.01); G01S 13/88 (2006.01); G01S 7/02 (2006.01); G01F 25/00 (2006.01); H01Q 1/22 (2006.01);
U.S. Cl.
CPC ...
G01S 7/2923 (2013.01); G01F 23/0069 (2013.01); G01F 23/284 (2013.01); G01S 13/103 (2013.01); G01S 13/522 (2013.01); G01S 13/88 (2013.01); G01F 25/0061 (2013.01); G01S 2007/027 (2013.01); H01Q 1/225 (2013.01);
Abstract

A level measurement instrument comprises an analog circuit for transmitting a pulse signal at a target of interest and receiving reflected echoes of the pulse signal and developing an echo waveform representative of the reflected echoes. A programmed digital circuit is operatively coupled to the analog circuit and comprises a programmed controller and memory. The controller is operatively programmed to identify peaks in the echo waveform and store an active peak list in the memory from a current measurement scan and a buffer peak list from prior measurement scans. The controller is further programmed to match peaks in the active peak list to peaks in the buffer peak list, to select a target peak from the active peak list based on which of the matched peaks have moved, and determining material level responsive to the target peak.


Find Patent Forward Citations

Loading…