The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2020

Filed:

Dec. 26, 2017
Applicant:

Uih America, Inc., Houston, TX (US);

Inventors:

Hui Liu, Houston, TX (US);

Yu Ding, Houston, TX (US);

Assignee:

UIH AMERICA, INC., Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/48 (2006.01); G01R 33/58 (2006.01); G01R 33/561 (2006.01);
U.S. Cl.
CPC ...
G01R 33/4818 (2013.01); G01R 33/561 (2013.01); G01R 33/5611 (2013.01); G01R 33/583 (2013.01);
Abstract

A method for magnetic resonance imaging (MRI) may include obtaining a plurality of k-space datasets related to a scanning of a subject performed by an MRI scanner. The method may also include obtaining at least one filter for processing the plurality of k-space datasets, and applying the at least one filter to the plurality of k-space datasets convolutionally to obtain a plurality of processed k-space datasets. By applying the at least one filter, an application region extending through the plurality of k-space datasets may be determined within the plurality of k-space datasets, and a data point within the application region may be modified based at least on the other data points within the application region. The method may further include generating an image based on at least one of the processed k-space datasets.


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