The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2020

Filed:

Dec. 17, 2019
Applicant:

Quantum Valley Ideas Laboratories, Waterloo, CA;

Inventors:

James Keaveney, Waterloo, CA;

Jennifer Ann Joe Erskine, Waterloo, CA;

Chang Liu, Waterloo, CA;

Geoffrey Gordon Gillett, Waterloo, CA;

James P. Shaffer, Kitchener, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01); G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0885 (2013.01); G01R 29/10 (2013.01);
Abstract

In a general aspect, an imaging method is presented that includes receiving, at a vapor-cell sensor, input optical signals and electromagnetic radiation from at least a test device to generate an output optical signal. The output optical signal is processed at a single pixel camera to generate camera output data. An image of the electromagnetic radiation is constructed by operation of a computer system based on the camera output data. In some implementations, the single pixel camera includes a patterned light generator and a photodetector. In these implementations, the imaging method includes receiving, at the photodetector, patterned instances of the output optical signal generated by the patterned light generator. Each patterned instance represents a respective portion of the image of the electromagnetic radiation. Moreover, the intensity of each patterned instance may be measured, by operation of at least the photodetector, to generate the camera output data.


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