The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2020
Filed:
Sep. 12, 2018
Boe Technology Group Co., Ltd., Beijing, CN;
Ordos Yuansheng Optoelectronics Co., Ltd., Inner Mongolia, CN;
Haiyan Xu, Beijing, CN;
Dong Wang, Beijing, CN;
Wenlong Zhao, Beijing, CN;
Huan Tang, Beijing, CN;
Hyunjin Kim, Beijing, CN;
Lei Zhang, Beijing, CN;
Zhao Wang, Beijing, CN;
Le Sun, Beijing, CN;
BOE TECHNOLOGY GROUP CO., LTD., Beijing, CN;
ORDOS YUANSHENG OPTOELECTRONICS CO., LTD., Inner Mongolia, CN;
Abstract
The embodiments of the present application provide a detection method and a detection device. The detection device includes: a capacitance generation circuit comprising a first capacitance electrode and a second capacitance electrode disposed opposite to each other, and a power source coupled to the first and the second capacitance electrode, the first capacitance electrode is an electrode plate, and the second capacitance electrode comprises n sub-electrodes which are provided to be insulated from each other; at least one capacitance detection circuit coupled to the electrode plate and the sub-electrodes, and configured to detect a capacitance value between the electrode plate and the sub-electrodes in response to a substrate to be tested being placed on one side of the electrode plate; and a controller configured to determine, according to the detected capacitance value, whether a foreign object exists in a region on the substrate to be tested or not.