The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2020
Filed:
May. 20, 2014
Shimadzu Corporation, Kyoto-shi, Kyoto, JP;
Kenichi Mishima, Kameoka, JP;
Etsuho Kamata, Kameoka, JP;
Hiroshi Miura, Kyoto, JP;
Yasuhiro Mito, Kyotanabe, JP;
Toshinobu Yanagisawa, Kyoto, JP;
SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;
Abstract
A chromatogram data processing system having an impurity detector including a differential chromatogram creator, a purity curve creator and a determiner. The differential chromatogram creator calculates a differential coefficient of an absorbance spectrum with respect to wavelength at a local maximum or local minimum absorption wavelength of the target component, and creates a differential chromatogram which shows a temporal change of the differential coefficient. The purity curve creator creates a purity curve which shows a temporal change of the difference between the degree of similarity of a spectrum on the target peak to a reference spectrum and a threshold of the degree of similarity which is determined taking into account the influence of noise components. The differential chromatogram and the purity curve are displayed on a display unit in a superposed form on a wavelength chromatogram created by a wavelength chromatogram creator.